I-Cite’s integrated features include:
- Overlapped image acquisition and processing
- Multiple, asynchronous, simultaneous inspections
- Multiple, simultaneous frame grabber support
- Support for up to 16 analog, digital, Camera Link, USB, IEEE 1394, and Gigabit Ethernet cameras per application
- 8-bit, 10-bit and 12-bit image depth support.
- Strobe control for “on the fly” image acquisition
- Multiple, asynchronous , concurrent machine interfaces (Socket, Pipe, RS-232, DIO)
- Variable rate digital video recorder
- Failed part image collection and analysis tools (FailurePackets™) with built-in Internet support
- “Drill down” graphical diagnostic capability for all image processing operations
- Protocol and logic analyzer
- Remote imbedded display capability
- Pan/tilt control for automated feature/target tracking
- Four level customizable access levels (password proteted)
- Online help (F1 help and chip level help)
- Fully customizable data collection reports
- Fully customizable GUIs with drag and drop GUI builder
- Fully customizable runtime displays
I-Cite’s image processing features include:
- Pattern location (high frequency, low frequency, and model based)
- Defect Detection (completeness, correct assembly and/or surface)
- 2D, 3D Part gauging
- Color Processing
- Thermal Processing
- Grayscale processing (kernel based)
- Semiconductor inspection (BGA, QFP, TSOP, etc.)
- 2D bar code reading (2D matrix)
- Grayscale template matching
- Connected component analysis
- Typical accuracies:
- Edge detection: +/- 0.25 pixels (3 sigma)
- Feature location: +/- 0.20 pixels (3 sigma)
- Typical processing times (3 GHz P4):
- Sub Pixel Edge Location: 0.2 ms
- Sub Pixel Feature Location (full screen search, 1296 x 1016): 12 ms
- Sub Pixel Feature Location (window search, 100 x 100): 0.25 ms
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